Research of Integrated Test System of Potentiometer Electric Parameter Based on Multi-CPU Control

DOI

10.2991/emim-15.2015.57How to use a DOI?

Keywords

Potentiometer; Integrated Test System; Multi-CPU; STC Microcontroller

Abstract

The problems of low testing efficiency and high testing cost exist in small and medium potentiometer enterprises when multi-station and multi-instrument are used to respectively test potentiometer electric parameters. The paper propose a designing project based on the integrated test system of multi-CPU , analyzes the working principle of the system and introduces in detail the software and hardware design. The result of the experiment indicates that this system not only enjoys high test precision and fast speed, but also reduces effectively the testing cost.

Copyright

© 2015, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Jingping Yuan
AU  - Xiaorong Zhao
AU  - Fenfen Yu
PY  - 2015/04
DA  - 2015/04
TI  - Research of Integrated Test System of Potentiometer Electric Parameter Based on Multi-CPU Control
BT  - Proceedings of the 2015 International Conference on Education, Management, Information and Medicine
PB  - Atlantis Press
SP  - 293
EP  - 297
SN  - 2352-5428
UR  - https://doi.org/10.2991/emim-15.2015.57
DO  - 10.2991/emim-15.2015.57
ID  - Yuan2015/04
ER  -