Proceedings of the 2nd International Conference on Electronic & Mechanical Engineering and Information Technology (EMEIT 2012)

<Previous Article In Volume
Next Article In Volume>

The Impact of Residual Stress Relaxation on Fatigue Life Enhancing Effect of Cold Expansion

Authors
Di GUAN, Qin SUN
Corresponding Author
Di GUAN
Available Online September 2012.
DOI
10.2991/emeit.2012.492How to use a DOI?
Keywords
Residual Stress, Stress Relaxation, Cold Expansion, Fatigue Life Enhancing Ratio
Abstract

A numerical analysis was performed, using three-dimensional finite element method to assess the impact of residual stress relaxation on the fatigue strength benefit of cold expansion. Fatigue lives of cold expansion hole made from aluminium alloy 7050-T7451 under different relaxation time are presented, the results reveal that the fatigue life enhancing ratio is inversely proportional to the stress relaxation time, residual stress relaxation can weaken the benefit of cold expansion strongly.

Copyright
© 2012, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Download article (PDF)

<Previous Article In Volume
Next Article In Volume>
Volume Title
Proceedings of the 2nd International Conference on Electronic & Mechanical Engineering and Information Technology (EMEIT 2012)
Series
Advances in Intelligent Systems Research
Publication Date
September 2012
ISBN
978-90-78677-60-4
ISSN
1951-6851
DOI
10.2991/emeit.2012.492How to use a DOI?
Copyright
© 2012, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

risenwbib
TY  - CONF
AU  - Di GUAN
AU  - Qin SUN
PY  - 2012/09
DA  - 2012/09
TI  - The Impact of Residual Stress Relaxation on Fatigue Life Enhancing Effect of Cold Expansion
BT  - Proceedings of the 2nd International Conference on Electronic & Mechanical Engineering and Information Technology (EMEIT 2012)
PB  - Atlantis Press
SP  - 2221
EP  - 2224
SN  - 1951-6851
UR  - https://doi.org/10.2991/emeit.2012.492
DO  - 10.2991/emeit.2012.492
ID  - GUAN2012/09
ER  -