Proceedings of the 2nd International Conference on Electronic & Mechanical Engineering and Information Technology (EMEIT 2012)

Diagnosis method for Analog Circuits fault using Bayesian network

Authors
Peng Jiao, Xinzheng Wang, Chunrong Li
Corresponding Author
Peng Jiao
Available Online September 2012.
DOI
10.2991/emeit.2012.436How to use a DOI?
Keywords
Bayesian network, dianosis, car radio, analog circuit
Abstract

Aiming at the uncertain problem in analog circuit fault diagnosis, a new method based on Bayesian network is proposed. Given a set of measurements from the circuit, and a set of possible faults, the task is to calculate the probability that the faults are present. This paper then discusses the methodology for diagnosis and the associated procedures for block-level diagnosis of analogue circuits in detail. Finally, the correctness and effectiveness of this method are validated by the fault diagnosis result of a voltage regulator used car radio.

Copyright
© 2012, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2nd International Conference on Electronic & Mechanical Engineering and Information Technology (EMEIT 2012)
Series
Advances in Intelligent Systems Research
Publication Date
September 2012
ISBN
978-90-78677-60-4
ISSN
1951-6851
DOI
10.2991/emeit.2012.436How to use a DOI?
Copyright
© 2012, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Peng Jiao
AU  - Xinzheng Wang
AU  - Chunrong Li
PY  - 2012/09
DA  - 2012/09
TI  - Diagnosis method for Analog Circuits fault using Bayesian network
BT  - Proceedings of the 2nd International Conference on Electronic & Mechanical Engineering and Information Technology (EMEIT 2012)
PB  - Atlantis Press
SP  - 1969
EP  - 1972
SN  - 1951-6851
UR  - https://doi.org/10.2991/emeit.2012.436
DO  - 10.2991/emeit.2012.436
ID  - Jiao2012/09
ER  -