Study on chemical mechanical ultra precision process technology of Aluminum Interconnected Line for ULSI
Authors
Xin Huan Niu, Juan Wang, Ming Sun, Baimei Tan, Baohong Gao
Corresponding Author
Xin Huan Niu
Available Online September 2012.
- DOI
- 10.2991/emeit.2012.330How to use a DOI?
- Keywords
- ULSI, Aluminum interconnection line, Chemical mechanical polishing
- Abstract
The chemical mechanical polishing ultra precision process technology mechanism of Aluminum Interconnected Line for ULSI was analyzed according the physical and chemical properties of Aluminum. In order to meet the request of environmental protection and reducing ion staining, the alkaline slurry was adopted. The selection reason of pH value regulator and surfactant was discussed, and their actions during polishing were analyzed. According to the experimental results and optimal technological parameters, the higher removal rate and lower surface roughness were gotten, which were 390nm/min and 0.47nm respectively.
- Copyright
- © 2012, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - Xin Huan Niu AU - Juan Wang AU - Ming Sun AU - Baimei Tan AU - Baohong Gao PY - 2012/09 DA - 2012/09 TI - Study on chemical mechanical ultra precision process technology of Aluminum Interconnected Line for ULSI BT - Proceedings of the 2nd International Conference on Electronic & Mechanical Engineering and Information Technology (EMEIT 2012) PB - Atlantis Press SP - 1491 EP - 1494 SN - 1951-6851 UR - https://doi.org/10.2991/emeit.2012.330 DO - 10.2991/emeit.2012.330 ID - Niu2012/09 ER -