Proceedings of the 2nd International Conference on Electronic & Mechanical Engineering and Information Technology (EMEIT 2012)

Research on Dimensional Measurement Based on Sub-pixel Edge Detection

Authors
Weidong Yang, Jiaxing Wang, Kai Peng, Dan Sun
Corresponding Author
Weidong Yang
Available Online September 2012.
DOI
10.2991/emeit.2012.286How to use a DOI?
Keywords
Sub-pixel, Edge Detection, Gaussian Fitting, Moment
Abstract

With the development of modern industry, image measurement technology with its high speed ,high precision and non-contact advantages receives high-profile attention. In the machine vision system the size of the process of mechanical parts measured, it is found that the accuracy of the edge position directly influence the accuracy of the measurement results. According to the research on the current sub-pixels positioning of image processing technology, this paper firstly makes a theory analysis and research about sub-pixel location methods based on gray level moment theory and the theory of Gaussian fitting. Then through the parts size measurement experiment, under the premise of contrast location with classical edge detection operators, some groups of data are extracted respectively compared to both of the detection performance and accuracy.Thus it provided the reference for the sub-pixels edge detection algorithm in the actual application.

Copyright
© 2012, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2nd International Conference on Electronic & Mechanical Engineering and Information Technology (EMEIT 2012)
Series
Advances in Intelligent Systems Research
Publication Date
September 2012
ISBN
978-90-78677-60-4
ISSN
1951-6851
DOI
10.2991/emeit.2012.286How to use a DOI?
Copyright
© 2012, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Weidong Yang
AU  - Jiaxing Wang
AU  - Kai Peng
AU  - Dan Sun
PY  - 2012/09
DA  - 2012/09
TI  - Research on Dimensional Measurement Based on Sub-pixel Edge Detection
BT  - Proceedings of the 2nd International Conference on Electronic & Mechanical Engineering and Information Technology (EMEIT 2012)
PB  - Atlantis Press
SP  - 1291
EP  - 1294
SN  - 1951-6851
UR  - https://doi.org/10.2991/emeit.2012.286
DO  - 10.2991/emeit.2012.286
ID  - Yang2012/09
ER  -