Study on Multi-path Low-light Stress Reliability Test System

DOI

10.2991/emeit.2012.232How to use a DOI?

Keywords

Low-light level night vision device, integrating sphere, low-light level stress, reliability test

Abstract

During the design approval and production approval tests on the low-light night version device, the light stress reliability test must be done. In this paper, the author analyzed the actual operational environment of the low-light night version device and designed a multi-path low-light reliability test system with adjustable illumination from two aspects including natural light spectrum and illumination in the night sky. Four-path combined integrating sphere low-light stress systems are adopted to simulate nighttime as the illumination quantificationally. During the test, the programs are designed according to the test so as to exert variable light stresses on the low light (namely product) automatically, monitor and control the light stress level automatically, identify and record the faults of the low-light night version device automatically, which soundly revolve the demands of the light stress reliability test of the low-light night version device.

Copyright

© 2012, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Lei ZHANG
AU  - Aiguo WANG
PY  - 2012/09
DA  - 2012/09
TI  - Study on Multi-path Low-light Stress Reliability Test System
BT  - Proceedings of the 2nd International Conference on Electronic & Mechanical Engineering and Information Technology (EMEIT 2012)
PB  - Atlantis Press
SP  - 1064
EP  - 1069
SN  - 1951-6851
UR  - https://doi.org/10.2991/emeit.2012.232
DO  - 10.2991/emeit.2012.232
ID  - ZHANG2012/09
ER  -