Proceedings of the 2nd International Conference on Electronic & Mechanical Engineering and Information Technology (EMEIT 2012)

Study on EDMn-B-00 Electrode and Surfacing Process

Authors
Li Yang, Xiangying Dang, Nan Ji, Meng Li
Corresponding Author
Li Yang
Available Online September 2012.
DOI
10.2991/emeit.2012.149How to use a DOI?
Keywords
Surfacing, Orthogonal experiment, Work hardening, Abrasive property
Abstract

For the defect of high manganese steel surfacing electrode on manufacturability, EDMn-B-00 electrode was trial product by means of orthogonal experiment. It relays on coating to transit alloying elements. The manufacturability and usability were evaluated by chemical composition analysis, resist thermal crack test, static load work hardening test, dynamic load work hardening test and fractional wear test. The results show that activity of electrode slag is big. Melting point of electrode slag is low. Composition of deposited metal is close to that of base metal. Capability of thermal crack resist is well. Work hardening effect of deposited metal is obvious. Abrasive capability of deposited metal is superior to that of base metal.

Copyright
© 2012, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2nd International Conference on Electronic & Mechanical Engineering and Information Technology (EMEIT 2012)
Series
Advances in Intelligent Systems Research
Publication Date
September 2012
ISBN
978-90-78677-60-4
ISSN
1951-6851
DOI
10.2991/emeit.2012.149How to use a DOI?
Copyright
© 2012, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Li Yang
AU  - Xiangying Dang
AU  - Nan Ji
AU  - Meng Li
PY  - 2012/09
DA  - 2012/09
TI  - Study on EDMn-B-00 Electrode and Surfacing Process
BT  - Proceedings of the 2nd International Conference on Electronic & Mechanical Engineering and Information Technology (EMEIT 2012)
PB  - Atlantis Press
SP  - 701
EP  - 704
SN  - 1951-6851
UR  - https://doi.org/10.2991/emeit.2012.149
DO  - 10.2991/emeit.2012.149
ID  - Yang2012/09
ER  -