Proceedings of the 2016 International Conference on Education, Management, Computer and Society

The Software Testing Method Application and Research of Embedded Electronic System

Authors
Yanping Wei
Corresponding Author
Yanping Wei
Available Online January 2016.
DOI
10.2991/emcs-16.2016.208How to use a DOI?
Keywords
Electronic system; embedded software; signal information selection; software testing
Abstract

With the rapid development of computer hardware and software technology, the hardware size and performance of embedded system have been greatly improved, accordingly, the complexity and size of the embedded system software have also doubled. However, the particularity of the embedded system requires the hardware system and application software operated on it to be concise and efficient, stable and reliable. This makes the proportion of the software development in the whole embedded system development higher and higher. The software quality plays a crucial role in the whole product quality .As a result, we urgently need a testing method and tools for embedded field to improve software quality and reliability, shorten the software development period and reduce development costs. Under this background, this paper goes into the testing technology of embedded electronic system software and applies the research results to testing. From the actual needs, it goes into the software metrics technology and applies it to vehicle electronic system testing.

Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Download article (PDF)

Volume Title
Proceedings of the 2016 International Conference on Education, Management, Computer and Society
Series
Advances in Computer Science Research
Publication Date
January 2016
ISBN
978-94-6252-158-2
ISSN
2352-538X
DOI
10.2991/emcs-16.2016.208How to use a DOI?
Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Yanping Wei
PY  - 2016/01
DA  - 2016/01
TI  - The Software Testing Method Application and Research of Embedded Electronic System
BT  - Proceedings of the 2016 International Conference on Education, Management, Computer and Society
PB  - Atlantis Press
SP  - 851
EP  - 853
SN  - 2352-538X
UR  - https://doi.org/10.2991/emcs-16.2016.208
DO  - 10.2991/emcs-16.2016.208
ID  - Wei2016/01
ER  -