The Key Technology and Algorithm Design for the Development of Intelligent Examination System
- DOI
- 10.2991/emcm-15.2016.141How to use a DOI?
- Keywords
- Intelligent examination system; Three layer development; Silverlight; Algorithm of generating test paper; Performance analysis algorithm
- Abstract
Traditional examination by the teacher to choose, group, organization, after the examination, and then by the examination papers to correct, determine the results. Therefore, many factors, such as the standardization degree, the difficulty degree and the rationality of the evaluation, are more easily influenced by the subjective factors. And traditional examination group, organization, examination paper evaluation, performance analysis, test paper retained heavy workload big, such as task. In addition, the traditional test feedback ability is weak, embodied in an exam paper choose optional the gender is big, and the analysis of the results stay on average, pass the surface level. Some of the existing online examination system to achieve a paperless examination, But in the volume group, and result analysis, the basic is the same as the traditional way. This paper mainly discusses the key technology of the development of the intelligent test system, focusing on generating test paper algorithm design and achievement data mining algorithm for the analysis of the design, so as to improve the system test paper quality and performance analysis for teaching and learning in the future to provide detailed decision analysis.
- Copyright
- © 2016, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - Kai Lu AU - Mingrui Chen PY - 2016/02 DA - 2016/02 TI - The Key Technology and Algorithm Design for the Development of Intelligent Examination System BT - Proceedings of the International Conference on Electronics, Mechanics, Culture and Medicine PB - Atlantis Press SP - 775 EP - 779 SN - 2352-538X UR - https://doi.org/10.2991/emcm-15.2016.141 DO - 10.2991/emcm-15.2016.141 ID - Lu2016/02 ER -