Proceedings of the 3rd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2017)

Study of the Electronic Current Transformer's Additional Error Testing

Authors
Chun-Yan YANG, Deng-Yun LI, Hao-Liang HU, Hui PENG, Li YAO, Tao XU
Corresponding Author
Chun-Yan YANG
Available Online September 2017.
DOI
10.2991/eeeis-17.2017.21How to use a DOI?
Keywords
electronic voltage transformer, error test, temperature characteristics, primary connection characteristics, harmonic characteristics
Abstract

Abstract: The measurement accuracy of the electronic current transformer are susceptible to environmental factors and interference of external magnetic field. Based on analyzing the effect of temperature, primary wiring and harmonic factor on the measurement accuracy of current transformer of rogowski coil and full optical fiber current transformer, this paper formulated corresponding protocol and tested the additional error of two kinds of electronic current transformers. After comparison and analysis of experimental data, this paper got the error characteristics of temperature, primary wiring and harmonics.

Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 3rd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2017)
Series
Advances in Engineering Research
Publication Date
September 2017
ISBN
978-94-6252-400-2
ISSN
2352-5401
DOI
10.2991/eeeis-17.2017.21How to use a DOI?
Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Chun-Yan YANG
AU  - Deng-Yun LI
AU  - Hao-Liang HU
AU  - Hui PENG
AU  - Li YAO
AU  - Tao XU
PY  - 2017/09
DA  - 2017/09
TI  - Study of the Electronic Current Transformer's Additional Error Testing
BT  - Proceedings of the 3rd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2017)
PB  - Atlantis Press
SP  - 143
EP  - 149
SN  - 2352-5401
UR  - https://doi.org/10.2991/eeeis-17.2017.21
DO  - 10.2991/eeeis-17.2017.21
ID  - YANG2017/09
ER  -