Proceedings of the 2nd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2016)

A trusted routing algorithm based on D-S evidence theory combined with physical layer security

Authors
Lin Ma, Chong Tan, Jun Pan, Kai Yu
Corresponding Author
Lin Ma
Available Online December 2016.
DOI
10.2991/eeeis-16.2017.82How to use a DOI?
Keywords
Trusted routing; Dempster-Shafer Theory; Trust Evaluation Model
Abstract

With the rapid development of the communication technology, the traditional routing algorithms which only consider functional QoS metrics are difficult to meet the needs of applications. In this paper, we propose a trusted routing algorithm to overcome this problem. First, we propose a trust evaluation model of service instances based on the Dempster-Shafer theory combined with physical layer security, and then the trusted routing algorithm is proposed by using this model to improve the traditional routing algorithms. The simulation results show that the proposed trusted routing algorithm can effectively improve the success rate of routing and the performance of the QoS metrics.

Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2nd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2016)
Series
Advances in Engineering Research
Publication Date
December 2016
ISBN
978-94-6252-320-3
ISSN
2352-5401
DOI
10.2991/eeeis-16.2017.82How to use a DOI?
Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Lin Ma
AU  - Chong Tan
AU  - Jun Pan
AU  - Kai Yu
PY  - 2016/12
DA  - 2016/12
TI  - A trusted routing algorithm based on D-S evidence theory combined with physical layer security
BT  - Proceedings of the 2nd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2016)
PB  - Atlantis Press
SP  - 675
EP  - 684
SN  - 2352-5401
UR  - https://doi.org/10.2991/eeeis-16.2017.82
DO  - 10.2991/eeeis-16.2017.82
ID  - Ma2016/12
ER  -