Study on the relationship between the gray value of the image in the vicinity of the weld pool and the instantaneous voltage in CO2 welding
- DOI
- 10.2991/eeeis-16.2017.73How to use a DOI?
- Keywords
- CO2 welding; Gray value; Instantaneous voltage
- Abstract
Since the region near the CO2 welding of short circuiting transfer process of weld pool of light intensity changes, seriously affect the real-time and reliability of weld seam feature extraction, the application and development of CO2 welding seam tracking technology based on vision has been severely restricted. The change of instantaneous voltage can reflect the arc length changes very well and reflect changes in the strength of the arc. Numerical models were established between the gray value of the image captured by the CCD camera and the instantaneous voltage in the CO2 welding process, and the systematic study and analysis of the relative change between the two. Experimental results show that: in the short circuit phase, with the decrease of the instantaneous voltage, image average gray value decreases. At the open circuit stage, instantaneous voltage is greater than 12.3854V,with the increase of voltage, increasing average gray value of image; when the instantaneous voltage between 6.7708V to 12.3854V,as the voltage increases, the average gray value of the image is reduced; when the instantaneous voltage is less than 6.7708V,with the increase of voltage, increasing average gray value of image.
- Copyright
- © 2017, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - Xiao-Gang Liu AU - Tian-Yuan Liu AU - Shi Huang PY - 2016/12 DA - 2016/12 TI - Study on the relationship between the gray value of the image in the vicinity of the weld pool and the instantaneous voltage in CO2 welding BT - Proceedings of the 2nd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2016) PB - Atlantis Press SP - 596 EP - 604 SN - 2352-5401 UR - https://doi.org/10.2991/eeeis-16.2017.73 DO - 10.2991/eeeis-16.2017.73 ID - Liu2016/12 ER -