Proceedings of the 2nd International Conference on Electrical and Electronic Engineering (EEE 2019)

Analysis on Trade Patterns in Electronic and Electrical Products: An Empirical Study of the U.S from 2008 to 2017

Authors
Fei Wang, Yang Yu, Hui-long Li
Corresponding Author
Yang Yu
Available Online July 2019.
DOI
10.2991/eee-19.2019.1How to use a DOI?
Keywords
Comparative advantage, Trade pattern, Trade barrier
Abstract

The development and protection of electronic and electrical industries are essential parts to America’s national strategy. Using data from UNCOMTRADE database, This paper analyzed trade patterns in electronic and electrical products (HT1 category in Rev.2 classification) in the US from 2008 to 2017. By comparing NXR, RSCA and h indicators of individual HT1 product, we found distortions did exit in the export of electronic and electrical products, which hints the US government has established trade barriers to protect intellectual properties and technical innovation of high-tech products. However, it seems harmful to products’ competence improvement in the long run. Further research has been carried out.

Copyright
© 2019, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2nd International Conference on Electrical and Electronic Engineering (EEE 2019)
Series
Advances in Engineering Research
Publication Date
July 2019
ISBN
978-94-6252-754-6
ISSN
2352-5401
DOI
10.2991/eee-19.2019.1How to use a DOI?
Copyright
© 2019, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Fei Wang
AU  - Yang Yu
AU  - Hui-long Li
PY  - 2019/07
DA  - 2019/07
TI  - Analysis on Trade Patterns in Electronic and Electrical Products: An Empirical Study of the U.S from 2008 to 2017
BT  - Proceedings of the 2nd International Conference on Electrical and Electronic Engineering (EEE 2019)
PB  - Atlantis Press
SP  - 1
EP  - 4
SN  - 2352-5401
UR  - https://doi.org/10.2991/eee-19.2019.1
DO  - 10.2991/eee-19.2019.1
ID  - Wang2019/07
ER  -