Method of Top-level Design for Automated Test Systems
Authors
Zhenjie Zeng, Xiaofei Zhu, Shiju Qi, Kai Wu, Xiaowei Shen
Corresponding Author
Zhenjie Zeng
Available Online June 2018.
- DOI
- 10.2991/eame-18.2018.52How to use a DOI?
- Keywords
- automatic test system; top-level design; requirements analysis; architecture selection; test equipment configuration
- Abstract
When designing an automatic test system, it is necessary to make each electronic test device conform to different test requirements. The most important issue is the system top-level design. The article starts with the three steps of the top-level design: system requirements analysis, architecture selection and analysis, and test equipment configuration. It describes in detail how to develop the top-level system design efficiently and reasonably when developing automated test systems. The principles, available method techniques, and precautions have some guiding significance for the top-level design of automated test systems.
- Copyright
- © 2018, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - Zhenjie Zeng AU - Xiaofei Zhu AU - Shiju Qi AU - Kai Wu AU - Xiaowei Shen PY - 2018/06 DA - 2018/06 TI - Method of Top-level Design for Automated Test Systems BT - Proceedings of the 2018 3rd International Conference on Electrical, Automation and Mechanical Engineering (EAME 2018) PB - Atlantis Press SP - 248 EP - 251 SN - 2352-5401 UR - https://doi.org/10.2991/eame-18.2018.52 DO - 10.2991/eame-18.2018.52 ID - Zeng2018/06 ER -