A Test Point Selection Method Based on Circuit Topology Graph

DOI

10.2991/csic-15.2015.95How to use a DOI?

Keywords

Circuit, Topology structure, Test point, Correlation matrix, Optimal test set

Abstract

To the question of test point selection in test or diagnosis for complex electronic equipments and large scale circuit, a test point selection method based on circuit topology and correlation modeling is proposed. This method, firstly, established the topology model based on circuit function structure, then the adjacency matrix of module connection relationship in reaction model and get the initial point set; secondly established correlation modeling using adjacency matrix; then, traversal correlation matrix and delete redundant test point based on reverse deletion strategy, obtain optimal test set; at last, verify this method with a example.

Copyright

© 2015, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Xiusheng Duan
AU  - Yi Huang
AU  - Yunfeng Zhou
PY  - 2015/07
DA  - 2015/07
TI  - A Test Point Selection Method Based on Circuit Topology Graph
BT  - Proceedings of the 2015 International Conference on Computer Science and Intelligent Communication
PB  - Atlantis Press
SP  - 394
EP  - 397
SN  - 2352-538X
UR  - https://doi.org/10.2991/csic-15.2015.95
DO  - 10.2991/csic-15.2015.95
ID  - Duan2015/07
ER  -