Proceedings of the 2nd International Conference on Civil, Materials and Environmental Sciences

The Design of Coulometric Thickness Gauge Based on Microprocessor

Authors
Limin Cai, Song Tang, Shizhen Zhang, Wu Xia
Corresponding Author
Limin Cai
Available Online April 2015.
DOI
10.2991/cmes-15.2015.102How to use a DOI?
Keywords
Single-chip microprocessor; gauge; numerical control constant current source
Abstract

In order to solve the issues of low accuracy, existing electrolytic coating thickness, poor reproducibility, lack of self-checking, data is difficult to store and handle urgent need to address, we designed a portable gauge based on Coulomblaw. This paper describes the system design of electrolytic thickness, the hardware and software design. Gauge meets factory testing needs through a variety of different materials, coatings extensive experiments.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2nd International Conference on Civil, Materials and Environmental Sciences
Series
Advances in Engineering Research
Publication Date
April 2015
ISBN
978-94-62520-58-5
ISSN
2352-5401
DOI
10.2991/cmes-15.2015.102How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Limin Cai
AU  - Song Tang
AU  - Shizhen Zhang
AU  - Wu Xia
PY  - 2015/04
DA  - 2015/04
TI  - The Design of Coulometric Thickness Gauge Based on Microprocessor
BT  - Proceedings of the 2nd International Conference on Civil, Materials and Environmental Sciences
PB  - Atlantis Press
SP  - 366
EP  - 368
SN  - 2352-5401
UR  - https://doi.org/10.2991/cmes-15.2015.102
DO  - 10.2991/cmes-15.2015.102
ID  - Cai2015/04
ER  -