The Design of Coulometric Thickness Gauge Based on Microprocessor
Authors
Limin Cai, Song Tang, Shizhen Zhang, Wu Xia
Corresponding Author
Limin Cai
Available Online April 2015.
- DOI
- 10.2991/cmes-15.2015.102How to use a DOI?
- Keywords
- Single-chip microprocessor; gauge; numerical control constant current source
- Abstract
In order to solve the issues of low accuracy, existing electrolytic coating thickness, poor reproducibility, lack of self-checking, data is difficult to store and handle urgent need to address, we designed a portable gauge based on Coulomblaw. This paper describes the system design of electrolytic thickness, the hardware and software design. Gauge meets factory testing needs through a variety of different materials, coatings extensive experiments.
- Copyright
- © 2015, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - Limin Cai AU - Song Tang AU - Shizhen Zhang AU - Wu Xia PY - 2015/04 DA - 2015/04 TI - The Design of Coulometric Thickness Gauge Based on Microprocessor BT - Proceedings of the 2nd International Conference on Civil, Materials and Environmental Sciences PB - Atlantis Press SP - 366 EP - 368 SN - 2352-5401 UR - https://doi.org/10.2991/cmes-15.2015.102 DO - 10.2991/cmes-15.2015.102 ID - Cai2015/04 ER -