Proceedings of the International Conference on Communication and Electronic Information Engineering (CEIE 2016)

Reversible Data Hiding Based on Histogram Modification Using S-Type And Hilbert Curve Scanning

Authors
Ruisong Ye, Jin Chen, Xing Zhang
Corresponding Author
Ruisong Ye
Available Online October 2016.
DOI
10.2991/ceie-16.2017.25How to use a DOI?
Keywords
Reversible Data Hiding; Difference; Histogram Modification
Abstract

Standard bat algorithm is easy to fall into local optimum to handle complex functions with high- dimension. This paper proposes a hybrid chaotic mutation bat algorithm handling local convergence. The chaotic variables and mutation operator are introduced to bat algorithm to enhance its global search ability. The simulation experimental results based on typical test functions show that the improved algorithm can effectively improve the global optimization ability of the bat algorithm and significantly improve the accuracy of the algorithm optimization and convergence efficiency.

Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the International Conference on Communication and Electronic Information Engineering (CEIE 2016)
Series
Advances in Engineering Research
Publication Date
October 2016
ISBN
978-94-6252-312-8
ISSN
2352-5401
DOI
10.2991/ceie-16.2017.25How to use a DOI?
Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Ruisong Ye
AU  - Jin Chen
AU  - Xing Zhang
PY  - 2016/10
DA  - 2016/10
TI  - Reversible Data Hiding Based on Histogram Modification Using S-Type And Hilbert Curve Scanning
BT  - Proceedings of the International Conference on Communication and Electronic Information Engineering (CEIE 2016)
PB  - Atlantis Press
SP  - 184
EP  - 190
SN  - 2352-5401
UR  - https://doi.org/10.2991/ceie-16.2017.25
DO  - 10.2991/ceie-16.2017.25
ID  - Ye2016/10
ER  -