Machine Learning Methods for Intelligent Abnormal Brain Identification
Authors
Fangyuan Liu, Siyuan Lu, Leonid Snetkov
Corresponding Author
Fangyuan Liu
Available Online May 2017.
- DOI
- 10.2991/ammsa-17.2017.94How to use a DOI?
- Keywords
- pathological brain detection; machine learning; intelligent algorithm; category recognition
- Abstract
This survey paper describes a focused literature survey of machine learning methods in order to detect pathological brain. Based on the published time and emerging methods, this paper introduces in details the methods used in each documents. Because of the requirement to select a good approach in the process of pathological brain analysis, we compare the classification results of different methods and present a promising future.
- Copyright
- © 2017, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - Fangyuan Liu AU - Siyuan Lu AU - Leonid Snetkov PY - 2017/05 DA - 2017/05 TI - Machine Learning Methods for Intelligent Abnormal Brain Identification BT - Proceedings of the 2017 International Conference on Applied Mathematics, Modelling and Statistics Application (AMMSA 2017) PB - Atlantis Press SP - 420 EP - 422 SN - 1951-6851 UR - https://doi.org/10.2991/ammsa-17.2017.94 DO - 10.2991/ammsa-17.2017.94 ID - Liu2017/05 ER -