Optimum Plan for Step-down-stress Accelerated Life Testing with Censoring and Numerical Simulation

DOI

10.2991/amms-17.2017.41How to use a DOI?

Keywords

exponential distribution; step-down-stress accelerated life testing; accelerating life equation; numerical simulation

Abstract

In this paper, we obtain the optimum plan by discussing a step-down-stress accelerated life testing (SDS-ALT) satisfying some specific condition at k stresses under an exponential distribution.

Copyright

© 2017, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Yu Wang
AU  - Xiaoqin Zhang
AU  - Dianjun Lu
PY  - 2017/11
DA  - 2017/11
TI  - Optimum Plan for Step-down-stress Accelerated Life Testing with Censoring and Numerical Simulation
BT  - Proceedings of the 2017 International Conference on Applied Mathematics, Modeling and Simulation (AMMS 2017)
PB  - Atlantis Press
SP  - 186
EP  - 189
SN  - 1951-6851
UR  - https://doi.org/10.2991/amms-17.2017.41
DO  - 10.2991/amms-17.2017.41
ID  - Wang2017/11
ER  -