Thermodynamic Model of Semiconductor Refrigeration System Based on Peltier Effect

DOI

10.2991/ammee-17.2017.12How to use a DOI?

Keywords

Semiconductor refrigeration, Peltier effect, thermodynamic model.

Abstract

With the development of society, people's requirements on the comfort of environment have been further improved. The semiconductor refrigeration technology, with the increase of material merit, has been greatly developed and widely used in civil and military fields. This paper, starting from the Peltier effect, first of all analyzes the influence of optimal coefficient and temperature difference on semiconductor refrigeration system in two kinds of extreme conditions. In addition, the curves of various factors on the semiconductor refrigeration are determined, which intuitively reflect the effects of various factors on the semiconductor refrigeration and their relationship. Secondly, based on the simulation results of the thermodynamic model, the impact of various factors on the semiconductor refrigeration system is simulated and the temperature change in a small range of space is determined. What's more, the impacts of various factors on the semiconductor refrigeration is summed up, and optimized suggestions are put forward. The study results showed that the performance of semiconductor refrigeration system is influenced by many factors. Through the study of effects of various factors on the semiconductor refrigeration, the temperature changes of semiconductor refrigeration in space are simulated, which can provide technical support for the development of semiconductor system.

Copyright

© 2017, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Shucheng Xing
PY  - 2017/06
DA  - 2017/06
TI  - Thermodynamic Model of Semiconductor Refrigeration System Based on Peltier Effect
BT  - Proceedings of the Advances in Materials, Machinery, Electrical Engineering (AMMEE 2017)
PB  - Atlantis Press
SP  - 60
EP  - 66
SN  - 2352-5401
UR  - https://doi.org/10.2991/ammee-17.2017.12
DO  - 10.2991/ammee-17.2017.12
ID  - Xing2017/06
ER  -