Multiple Sclerosis Slice Identification by Haar Wavelet Transform and Logistic Regression
Authors
Xueyan Wu, Mason Lopez
Corresponding Author
Xueyan Wu
Available Online June 2017.
- DOI
- 10.2991/ammee-17.2017.10How to use a DOI?
- Keywords
- multiple sclerosis; slice identification; Haar wavelet transform; logistic regression
- Abstract
(Aim) Currently, scholars tend to use computer vision approaches to implement multiple sclerosis (MS) identification. (Method) In this study, we proposed a novel MS slice identification system, based on Haar wavelet transform, principal component analysis, and logistic regression. (Result) Simulation results showed the accuracies of our method using 2-level, 3-level, and 4-level decomposition are 83.25ñ1.62%, 89.72ñ1.18%, and 87.65ñ1.79%, respectively. (Conclusion) Our method with 3-level decomposition achieved the best.
- Copyright
- © 2017, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - Xueyan Wu AU - Mason Lopez PY - 2017/06 DA - 2017/06 TI - Multiple Sclerosis Slice Identification by Haar Wavelet Transform and Logistic Regression BT - Proceedings of the Advances in Materials, Machinery, Electrical Engineering (AMMEE 2017) PB - Atlantis Press SP - 50 EP - 55 SN - 2352-5401 UR - https://doi.org/10.2991/ammee-17.2017.10 DO - 10.2991/ammee-17.2017.10 ID - Wu2017/06 ER -