Proceedings of the 2016 4th International Conference on Advanced Materials and Information Technology Processing (AMITP 2016)

Analysis of fretting fatigue of late-model flat in the engineering application and research

Authors
Yongyan Wang, Chunlei Zeng, Yang Wu
Corresponding Author
Yongyan Wang
Available Online September 2016.
DOI
10.2991/amitp-16.2016.43How to use a DOI?
Keywords
ANSYS; flat; fretting fatigue; contact stress; finite element method.
Abstract

Applying the ANSYS, the three-dimensional finite element analysis is made on the late-model flat plane-to-plane contact. It also verifies the correctness of the flat fretting fatigue of the finite element analysis by comparing with Mindlin theory. It analyzes the factors such as stiffness coefficient and material properties which influence the flat fretting fatigue, and lays the theoretical foundation to solve wide carding machine flat in the actual plane-to-plane contact.

Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2016 4th International Conference on Advanced Materials and Information Technology Processing (AMITP 2016)
Series
Advances in Computer Science Research
Publication Date
September 2016
ISBN
978-94-6252-245-9
ISSN
2352-538X
DOI
10.2991/amitp-16.2016.43How to use a DOI?
Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Yongyan Wang
AU  - Chunlei Zeng
AU  - Yang Wu
PY  - 2016/09
DA  - 2016/09
TI  - Analysis of fretting fatigue of late-model flat in the engineering application and research
BT  - Proceedings of the 2016 4th International Conference on Advanced Materials and Information Technology Processing (AMITP 2016)
PB  - Atlantis Press
SP  - 218
EP  - 223
SN  - 2352-538X
UR  - https://doi.org/10.2991/amitp-16.2016.43
DO  - 10.2991/amitp-16.2016.43
ID  - Wang2016/09
ER  -