Proceedings of the International Conference on Advances in Mechanical Engineering and Industrial Informatics

An Improved Fruit Fly Optimization Algorithm and Its Application

Authors
HuiShu Shi, Ye San, Yi Zhu
Corresponding Author
HuiShu Shi
Available Online April 2015.
DOI
10.2991/ameii-15.2015.94How to use a DOI?
Keywords
fruit fly optimization algorithm; intelligent algorithm; SVM; analog circuit fault diagnosis
Abstract

Fruit fly optimization algorithm is a new swarm intelligent algorithm proposed in recent years and has been concerned for its few parameters and high computational efficiency. However, the application of the algorithm is limited for unstable optimization capability. To solve that question, an improved fruit fly optimization algorithm is proposed in this paper. Some factors affecting the performance of the algorithm are improved. The improved algorithm are proved by function optimization and applied to the analog circuit fault diagnosis.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Download article (PDF)

Volume Title
Proceedings of the International Conference on Advances in Mechanical Engineering and Industrial Informatics
Series
Advances in Engineering Research
Publication Date
April 2015
ISBN
978-94-62520-69-1
ISSN
2352-5401
DOI
10.2991/ameii-15.2015.94How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - HuiShu Shi
AU  - Ye San
AU  - Yi Zhu
PY  - 2015/04
DA  - 2015/04
TI  - An Improved Fruit Fly Optimization Algorithm and Its Application
BT  - Proceedings of the International Conference on Advances in Mechanical Engineering and Industrial Informatics
PB  - Atlantis Press
SP  - 497
EP  - 502
SN  - 2352-5401
UR  - https://doi.org/10.2991/ameii-15.2015.94
DO  - 10.2991/ameii-15.2015.94
ID  - Shi2015/04
ER  -