Proceedings of the 2015 International Conference on Artificial Intelligence and Industrial Engineering

Reliability Analysis Based on Coupled Relationship

Authors
W.L. Pan, H. Wang
Corresponding Author
W.L. Pan
Available Online July 2015.
DOI
10.2991/aiie-15.2015.19How to use a DOI?
Keywords
reliability; non-IIDness learning; coupled relationship
Abstract

In the usual reliability analysis, researchers often acquire the reliability information about a product by reliability tests and usually regard the product as a whole object to study. Also, the relationships between the attributes of the product are usually ignored. Base on the non-IIDness learning, the attributes of objects are more or less interacted and coupled. Thus, this paper analyzes the coupled relationships between each pair of product attributes and the coupled relationships between each product attribute and reliability lifetime of the product. Specifically, the attributes we analyzed are continuous. The level of interplay between each pair of attributes and between each attribute and product lifetime can be observed by coupled correlation matrices.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 International Conference on Artificial Intelligence and Industrial Engineering
Series
Advances in Intelligent Systems Research
Publication Date
July 2015
ISBN
978-94-62520-70-7
ISSN
1951-6851
DOI
10.2991/aiie-15.2015.19How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - W.L. Pan
AU  - H. Wang
PY  - 2015/07
DA  - 2015/07
TI  - Reliability Analysis Based on Coupled Relationship
BT  - Proceedings of the 2015 International Conference on Artificial Intelligence and Industrial Engineering
PB  - Atlantis Press
SP  - 69
EP  - 71
SN  - 1951-6851
UR  - https://doi.org/10.2991/aiie-15.2015.19
DO  - 10.2991/aiie-15.2015.19
ID  - Pan2015/07
ER  -