A High Accuracy Method for Measuring Nonlinear Scattering Parameters

DOI

10.2991/aetr-17.2018.60How to use a DOI?

Keywords

Large-signal Scattering functions; Linearization; Artificial neural networks

Abstract

This paper describes a way of measuring and modeling of microwave transistor nonlinear behavior. We describe a linearization of large-signal scattering functions describing weakly nonlinear device behavior. We illustrate the theory with transistor measurements and design a circuit to test data. Finally, apply Elman Artificial Neural Networks theory to model the large-signal scattering functions of a microwave source in its large-signal operating state.

Copyright

© 2018, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Qian Zhang
AU  - Xia Guo
AU  - Xueliu Pan
PY  - 2018/03
DA  - 2018/03
TI  - A High Accuracy Method for Measuring Nonlinear Scattering Parameters
BT  - Proceedings of the 2017 International Conference Advanced Engineering and Technology Research (AETR 2017)
PB  - Atlantis Press
SP  - 313
EP  - 316
SN  - 2352-5401
UR  - https://doi.org/10.2991/aetr-17.2018.60
DO  - 10.2991/aetr-17.2018.60
ID  - Zhang2018/03
ER  -