Proceedings of the 2016 International Conference on Advanced Electronic Science and Technology (AEST 2016)

Finite element checking of flange connection in integral hoisting of flare stack

Authors
Xuanyu Sheng, Hongzhi Zhang, You Bao, Chen Ling
Corresponding Author
Xuanyu Sheng
Available Online November 2016.
DOI
10.2991/aest-16.2016.50How to use a DOI?
Keywords
flange connection; flare stack; integral hoisting; CATIA finite-element-analysis; strengthen.
Abstract

Segmentation hoisting is generally used for flare stack with flange connection structure. This paper presents a technical innovation of integral hoisting of flare stack with flange connection structure. In the paper, CATIA finite-element-analysis is used to build 100% model of flare stack and to simulate working condition in both horizontal and vertical limit states during integral hoisting of flare stack. Strength and stability of flare stack during hoisting is checked and calculated, dangerous points are found, measures of strengthening weak structure are proposed and references are provided for hoisting procedure design and formulation of hoisting plan.

Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2016 International Conference on Advanced Electronic Science and Technology (AEST 2016)
Series
Advances in Intelligent Systems Research
Publication Date
November 2016
ISBN
978-94-6252-257-2
ISSN
1951-6851
DOI
10.2991/aest-16.2016.50How to use a DOI?
Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Xuanyu Sheng
AU  - Hongzhi Zhang
AU  - You Bao
AU  - Chen Ling
PY  - 2016/11
DA  - 2016/11
TI  - Finite element checking of flange connection in integral hoisting of flare stack
BT  - Proceedings of the 2016 International Conference on Advanced Electronic Science and Technology (AEST 2016)
PB  - Atlantis Press
SP  - 380
EP  - 386
SN  - 1951-6851
UR  - https://doi.org/10.2991/aest-16.2016.50
DO  - 10.2991/aest-16.2016.50
ID  - Sheng2016/11
ER  -