Proceedings of the 2016 International Conference on Advanced Electronic Science and Technology (AEST 2016)

Chaotic characteristics analysis of simulation signal of second harmonic generation effect

Authors
Hanying Mao, Yuhua Zhang, Hanling Mao, Zhenfeng Huang
Corresponding Author
Hanying Mao
Available Online November 2016.
DOI
10.2991/aest-16.2016.47How to use a DOI?
Keywords
nonlinear ultrasonic; nondestructive testing; fatigue crack extension; Lyapunov exponent.
Abstract

In order to deepen the understanding of nonlinear properties of specimen in the process of fatigue crack extension, the chaos and fractal theory are presented to analyze the second harmonic generation (SHG) signal of receiver in nonlinear ultrasonic system. Firstly the usefulness of chaos and fractal theory to analyze the SHG signal should be verified theoretically. By constructed the simulation signal of SHG effect, simulation signals with the character of chaotic was found, and it showed that the Lyapunov exponent was sensitive to weaker nonlinearity and unsusceptible to noise, and chaotic characteristic values could make up for inadequacies of the relative nonlinear coefficient.

Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2016 International Conference on Advanced Electronic Science and Technology (AEST 2016)
Series
Advances in Intelligent Systems Research
Publication Date
November 2016
ISBN
978-94-6252-257-2
ISSN
1951-6851
DOI
10.2991/aest-16.2016.47How to use a DOI?
Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Hanying Mao
AU  - Yuhua Zhang
AU  - Hanling Mao
AU  - Zhenfeng Huang
PY  - 2016/11
DA  - 2016/11
TI  - Chaotic characteristics analysis of simulation signal of second harmonic generation effect
BT  - Proceedings of the 2016 International Conference on Advanced Electronic Science and Technology (AEST 2016)
PB  - Atlantis Press
SP  - 362
EP  - 367
SN  - 1951-6851
UR  - https://doi.org/10.2991/aest-16.2016.47
DO  - 10.2991/aest-16.2016.47
ID  - Mao2016/11
ER  -