Proceedings of the 2016 International Conference on Advanced Electronic Science and Technology (AEST 2016)

Robustness analysis of digital image spearman's rho correlation

Authors
Wanghua Huang, Qinruo Wang, Weichao Xu, Yanzhou Zhou
Corresponding Author
Wanghua Huang
Available Online November 2016.
DOI
10.2991/aest-16.2016.29How to use a DOI?
Keywords
digital image correlation; salt-and-pepper noise; spearman's rho; deformation field distribution.
Abstract

The presence of salt-and-pepper noise in speckle image prevents the precise measurement of deformation and displacement fields in the traditional digital image correlation (DIC) technique. Spearman's rho (SR) has been introduced as a kernel correlation function in the DIC. The robustness of SR is quantitatively analyzed in following two cases: one is speckle images contaminated by same distribution salt-and-pepper noise, and the other is contaminated by random distribution noise. Theoretical and simulation results suggest that the DIC using SR is robust to about 10% salt-and-pepper noise. SR is suitable for measurement deformation and displacement fields.

Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2016 International Conference on Advanced Electronic Science and Technology (AEST 2016)
Series
Advances in Intelligent Systems Research
Publication Date
November 2016
ISBN
978-94-6252-257-2
ISSN
1951-6851
DOI
10.2991/aest-16.2016.29How to use a DOI?
Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Wanghua Huang
AU  - Qinruo Wang
AU  - Weichao Xu
AU  - Yanzhou Zhou
PY  - 2016/11
DA  - 2016/11
TI  - Robustness analysis of digital image spearman's rho correlation
BT  - Proceedings of the 2016 International Conference on Advanced Electronic Science and Technology (AEST 2016)
PB  - Atlantis Press
SP  - 223
EP  - 228
SN  - 1951-6851
UR  - https://doi.org/10.2991/aest-16.2016.29
DO  - 10.2991/aest-16.2016.29
ID  - Huang2016/11
ER  -