Proceedings of the 2nd International Symposium on Computer, Communication, Control and Automation

A Planar Metrology Method Based on Image Sequence

Authors
Hui Zeng, Baoqing Zhang, Zhichun Mu, Xiuqing Wang
Corresponding Author
Hui Zeng
Available Online April 2013.
DOI
10.2991/3ca-13.2013.74How to use a DOI?
Keywords
camera calibration, homography matrix, image sequence, planar metrology
Abstract

This paper presents a novel planar metrology method based on image sequence. Compared with the planar metrology method based on single image, the proposed method can enlarge the measuring range effectively. The main reference planar template and the auxiliary reference planar template are used to achieve the transformation between the three-dimensional coordinate systems of different images. The auxiliary reference planar template of the former image is the main reference planar template of the latter image, and their positions remain invariant in the process of the metrology. The main reference planar template are used to obtain the 3D measuring information and the auxiliary reference planar template are used to transform the coordinates of feature points to the same three-dimensional coordinate system. Extensive experimental results show that the proposed method can meet the need of the metrology of the large scene.

Copyright
© 2013, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2nd International Symposium on Computer, Communication, Control and Automation
Series
Advances in Intelligent Systems Research
Publication Date
April 2013
ISBN
978-90786-77-91-8
ISSN
1951-6851
DOI
10.2991/3ca-13.2013.74How to use a DOI?
Copyright
© 2013, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Hui Zeng
AU  - Baoqing Zhang
AU  - Zhichun Mu
AU  - Xiuqing Wang
PY  - 2013/04
DA  - 2013/04
TI  - A Planar Metrology Method Based on Image Sequence
BT  - Proceedings of the 2nd International Symposium on Computer, Communication, Control and Automation
PB  - Atlantis Press
SP  - 296
EP  - 299
SN  - 1951-6851
UR  - https://doi.org/10.2991/3ca-13.2013.74
DO  - 10.2991/3ca-13.2013.74
ID  - Zeng2013/04
ER  -