Volume 13, Issue 3, September 2014, Pages 247 - 262
On Record Values and Reliability Properties of Marshall–Olkin Extended Exponential Distribution
Authors
K.K. Jose, E. Krishna, Miroslav M. Ristic
Corresponding Author
K.K. Jose
Received 12 June 2014, Accepted 22 July 2014, Available Online 30 September 2014.
- DOI
- 10.2991/jsta.2014.13.3.6How to use a DOI?
- Keywords
- Auto regressive processes; Entropy; Exponential distribution; Marshall–Olkin distribution; Record values; Reliability; Sample path; Simulation; Stress-strength analysis
- Abstract
The Marshall–Olkin Extended Exponential distribution is introduced and reliability properties are studied. The p.d.f.’s of nth record value, joint p.d.f.’s, of mth and nth record values are derived to obtain the expression for mean, variance and covariance of reord values. The entropy of jth record value is derived.The stress strength analysis for the new model is carried out. We develop autoregressive processes and sample path properties are explored. The results are verified using simulations as well as graphical studies.The model is extended to higher orders also.
- Copyright
- © 2013, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - JOUR AU - K.K. Jose AU - E. Krishna AU - Miroslav M. Ristic PY - 2014 DA - 2014/09/30 TI - On Record Values and Reliability Properties of Marshall–Olkin Extended Exponential Distribution JO - Journal of Statistical Theory and Applications SP - 247 EP - 262 VL - 13 IS - 3 SN - 2214-1766 UR - https://doi.org/10.2991/jsta.2014.13.3.6 DO - 10.2991/jsta.2014.13.3.6 ID - Jose2014 ER -